![]() ![]() During this period, electronic tubes were the most failure-prone components used in electronic systems (McLinn, 1990 Denson, 1998). Lastly, this paper briefly reviews RIAC 217 Plus and identifies the shortcomings of this methodology.Īttempts to test and quantify the reliability of electronic components began in the 1940s during World War II. The effect of these shortcomings on the predictions obtained from MIL-HDBK-217 and similar methodologies are then demonstrated through a review of case studies. It then reviews some of the specific details of MIL-HDBK-217 and its progeny and summarizes the major pitfalls of MIL-HDBK-217 and similar approaches. This paper begins with a brief history of reliability prediction of electronics and MIL-HDBK-217. Anto Peter, Diganta Das, and Michael Pecht 1 ![]()
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